Role of the high-angle BSE in SEM imaging

Autor: L. Frank, I. Müllerová
Rok vydání: 2009
Předmět:
Zdroj: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547
DOI: 10.1007/978-3-540-85156-1_293
Popis: For acquisition of secondary (SE) as well as backscattered electrons (BSE) in the scanning electron microscope (SEM), single-channel detection systems are traditionally used. We have designed a multi-channel detector collecting BSE emitted to eight intervals of polar angles, and tested it also in the cathode lens mode (CLM) [1]. First experiments showed the method suitable for observation of polycrystalline targets [2].
Databáze: OpenAIRE