Precise Magnetometric Diagnostics of Critical-Current Inhomogeneities in High-Temperature Semiconductor Tapes
| Autor: | I. V. Anischenko, A. I. Podlivaev, Igor Rudnev, S. V. Pokrovskii |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Superconductivity Materials science Physics and Astronomy (miscellaneous) business.industry Inverse problem 01 natural sciences Magnetic field Computational physics Magnetization Semiconductor Feature (computer vision) Condensed Matter::Superconductivity Magnet 0103 physical sciences Critical current 010306 general physics business |
| Zdroj: | Technical Physics Letters. 43:1136-1139 |
| ISSN: | 1090-6533 1063-7850 |
| DOI: | 10.1134/s1063785017120240 |
| Popis: | We present a new precise method of contactless magnetometric determination of the local critical current in high-temperature superconductor (HTS) tapes, which involves (i) measurement of the spatial distribution of a magnetic field of currents induced due to magnetization of the tape by an array of permanent magnets and (ii) processing of the obtained results using a modified algorithm of solution of the Biot–Savart–Laplace inverse problem. The use of an array of permanent magnets is an important feature that distinguishes the proposed method from other existing techniques, since it allows the spatial distribution of critical current to be thoroughly analyzed over the entire tape area. |
| Databáze: | OpenAIRE |
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