A Study on Accelerated Life Test of Halogen Lamps for Medical Device

Autor: Yong Soo Kim, Jae Han Jung, Heonsang Lim, Myung-Soo Kim
Rok vydání: 2013
Předmět:
Zdroj: Journal of the Korean society for quality management. 41:659-672
ISSN: 1229-1889
DOI: 10.7469/jksqm.2013.41.4.659
Popis: Purpose: The purpose of this study was to estimate life time of halogen lamps and acceleration factors using accelerated life test.Methods: Voltage was selected as an accelerating variable through the technical review about failure mechanism. The test was performed at 14.5V, 15.5V and 16.5 for 4,471 hours. It was assumed that the lifetime of Halogen lamps follow Weibull distribution and the inverse power life-stress relationship models.Results: Mean lifetimes of pin and screw types were 19,477 hours and 6,056 hours, respectively. In addition, acceleration factor of two items are calculated as 4.8 and 2.2 based on 15.5V, respectively.Conclusion: The life-stress relationship, acceleration factor, and MTTF at design condition are estimated by analyzing the accelerated life test data. These results suggest that voltage was very important factor to accelerate life time in the case of halogen lamps and the life time of pin type is three times longer than screw type lamps.Key Words: Halogen Lamp, Accelerated Life Test, Inverse Power Model, Medical Device
Databáze: OpenAIRE