A toolbox of metrology-based techniques for optical system alignment
| Autor: | Raymond G. Ohl, John G. Hagopian, William L. Eichhorn, Kevin Redman, David A. Kubalak, Jerrod Young, Peter Blake, Joseph E. Hayden, Brent J. Bos, Kyle F. Mclean, Theodore Hadjimichael, Jeffrey S. Gum, Victor J. Chambers, Henry P. Sampler, Greg Wenzel, Joseph McMann, Phillip Coulter, Samuel E. Hetherington |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Optical alignment
Spacecraft business.industry Computer science Optical instrument James Webb Space Telescope Astrophysics::Instrumentation and Methods for Astrophysics ComputerApplications_COMPUTERSINOTHERSYSTEMS 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Toolbox law.invention Metrology 010309 optics law 0103 physical sciences Systems engineering 0210 nano-technology business Aerospace Simulation |
| Zdroj: | SPIE Proceedings. |
| ISSN: | 0277-786X |
| Popis: | The NASA Goddard Space Flight Center (GSFC) and its partners have broad experience in the alignment of flight optical instruments and spacecraft structures. Over decades, GSFC developed alignment capabilities and techniques for a variety of optical and aerospace applications. In this paper, we provide an overview of a subset of the capabilities and techniques used on several recent projects in a toolbox format. We discuss a range of applications, from small-scale optical alignment of sensors to mirror and bench examples that make use of various large-volume metrology techniques. We also discuss instruments and analytical tools. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|