Dislocation contrast on X-ray topographs under weak diffraction conditions
| Autor: | Tuerxun Ailihumaer, Xianrong Huang, Michael Dudley, Balaji Raghotharmachar, Hongyu Peng, Yafei Liu, Lahsen Assoufid |
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| Rok vydání: | 2021 |
| Předmět: |
Diffraction
Materials science Condensed matter physics Misorientation Orientation (computer vision) media_common.quotation_subject X-ray Lattice distortion Rocking curve General Biochemistry Genetics and Molecular Biology Condensed Matter::Materials Science Contrast (vision) Dislocation media_common |
| Zdroj: | Journal of Applied Crystallography. 54:1225-1233 |
| ISSN: | 1600-5767 |
| Popis: | The contrast of dislocations in 4H-SiC crystals shows distinctive features on grazing-incidence X-ray topographs for diffraction at different positions on the operative rocking curve. Ray-tracing simulations have previously been successfully applied to describe the dislocation contrast at the peak of a rocking curve.The present work shows that the dislocation images observed under weak diffraction conditions can also be simulated using the ray-tracing method. These simulations indicate that the contrast of the dislocations is dominated by orientation contrast. Analysis of the effective misorientation reveals that the dislocation contrast in weak-beam topography is more sensitive to the local lattice distortion, consequently enabling information to be obtained on the dislocation sense which cannot be obtained from the peak. |
| Databáze: | OpenAIRE |
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