Results From Testing of 145 3D Position-Sensitive, Pixelated CdZnTe Detectors
| Autor: | Zhong He, Yvan A. Boucher, Feng Zhang, Willy Kaye, Jason M. Jaworski |
|---|---|
| Rok vydání: | 2012 |
| Předmět: |
Physics
Nuclear and High Energy Physics Fabrication Physics::Instrumentation and Detectors business.industry Detector X-ray detector Wide-bandgap semiconductor Semiconductor detector Full width at half maximum Optics Nuclear Energy and Engineering Position (vector) Gamma ray detectors Optoelectronics High Energy Physics::Experiment Electrical and Electronic Engineering business |
| Zdroj: | IEEE Transactions on Nuclear Science. 59:3332-3338 |
| ISSN: | 1558-1578 0018-9499 |
| DOI: | 10.1109/tns.2012.2218829 |
| Popis: | Testing of 20 × 20 × 15 mm3 3D position sensitive, CdZnTe detectors grown by Redlen Technologies Inc. has shown that 98 out of the 145 detectors analyzed achieved sub-1% FWHM at 662 keV for single-pixel events. Improvements in the detector performance over time reflect the improvements in detector growth and fabrication over the past several years. In addition to the spectroscopic performance of the detectors, the imaging performance of each detector was also quantified. The results show that imaging is weakly correlated to the spectroscopic performance, and more strongly correlated to the accuracy of the depth reconstruction. Other detector issues such as gain deficit and gain variation are also discussed. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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