Non-Destructive Material Homogeneity Evaluation Using Scanning Millimeter Wave Microscopy

Autor:	J. Ikonikova, T. Anbinderis, A. Laurinavicius, Yu. Prishutov
Rok vydání:	2008
Předmět:	Materials science Physics::Instrumentation and Detectors business.industry General Physics and Astronomy Dielectric Optics Amplitude Extremely high frequency Homogeneity (physics) Microscopy Millimeter Wafer Anisotropy business
Zdroj:	Acta Physica Polonica A. 113:1051-1054
ISSN:	1898-794X 0587-4246
DOI:	10.12693/aphyspola.113.1051
Popis:	Millimeter wave bridge technique for non-destructive material homogeneity characterization is described. The idea of this technique is the local excitation of the millimeter waves in the testing material and the measurement of the transmitted (reflected) wave amplitude and phase in different places of it, i.e. the material plate is scanned by the beam of the millimeter waves. The results of the homogeneity measurements for dielectric wafers according to dielectric constant anisotropy are presented. The measurement technique sensitivity is discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::46b14b68b65f8a3fd752918e7749d1fa https://doi.org/10.12693/aphyspola.113.1051 Zobrazit plný text záznamu