Use of TlBr crystals for x- and γ-ray detectors

Autor:	M. S. Kuznetsov, V. S. Khrunov, I. P. Barkov, V. M. Zaletin, I. S. Lisitskii, I. M. Gazizov
Rok vydání:	2009
Předmět:	Physics business.industry Resolution (electron density) Detector X-ray Analytical chemistry chemistry.chemical_element Particle detector Semiconductor detector chemistry.chemical_compound Semiconductor Nuclear Energy and Engineering chemistry Bromide Thallium business
Zdroj:	Atomic Energy. 106:272-275
ISSN:	1573-8205 1063-4258
DOI:	10.1007/s10512-009-9163-9
Popis:	The development and investigations of uncooled semiconductor x- and γ-ray detectors based on thallium bromide crystals grown by the Bridgman-Stockbarger method are reported. The procedure for preparing Me-TlBr-Me (Me = Au, In) detector structures is described, and the current-voltage characteristics are investigated.The couting and spectrometric charactertics of the detectors fabricated have been investigated. The counting and spectrometric characteristics of the detectors fabricated have been measured. The best energy resolution was 0.54, 1.3, 1.41, 2.1, and 7.1 keV at energy 5.8 ( 55 Fe), 22.1 ( 109 Cd), 59.6 ( 241 AM), 122 ( 57 Co), and 662 keV ( 137 Cs), respectively.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::468d2364c3dbd32cfdc9889ff9ca15d3 https://doi.org/10.1007/s10512-009-9163-9 Zobrazit plný text záznamu Full text from SpringerLink