90-nm Digital Single Event Transient Pulsewidth Measurements

Autor:	Reed K. Lawrence, Neil E. Wood, Jason F. Ross
Rok vydání:	2010
Předmět:	Physics business.industry Electrical engineering Logic testing Optoelectronics Transient (oscillation) business Transient analysis Temperature measurement Event (probability theory) Shift register Ion
Zdroj:	2010 IEEE Radiation Effects Data Workshop.
DOI:	10.1109/redw.2010.5619492
Popis:	Single event transient (SET) pulsewidth measurements were made on 9SF 90 nm shift registers built with temporal delay latches on epitaxial substrates. Data was gathered using heavy ions from LETs of 9.75 to 58.78 (MeV-cm2)/mg.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::468b5d10505007fa21631066af3cd824 https://doi.org/10.1109/redw.2010.5619492 Zobrazit plný text záznamu