Ultrafast Transport Measurements in Bulk Semiconductors and Tunneling Devices Using Electro-Optic Sampling

Autor:	Kevin E. Meyer
Rok vydání:	1989
Předmět:	Materials science Dye laser business.industry Resonant-tunneling diode Physics::Optics Pockels effect Semiconductor Velocity overshoot Electronic engineering Optoelectronics Transient (oscillation) business Ultrashort pulse Quantum tunnelling
Zdroj:	NATO ASI Series ISBN: 9781475765670
DOI:	10.1007/978-1-4757-6565-6_37
Popis:	Electro-optic sampling (EOS) is a technique which has been developed for measuring transient electrical fields with subpicosecond resolution. It takes advantage of the inherent speed of the linear electro-optic effect (Pockels effect) to convert a fast electrical transient into a fast optical transient. The optical transient is then probed using the conventional pump/probe approach in conjunction with a short-pulse dye laser. Two applications of this technique will be discussed which are relevant to the study of transport physics on small time and dimension scales.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4686770aa526ce86fdbd2979e226471b https://doi.org/10.1007/978-1-4757-6565-6_37 Zobrazit plný text záznamu