ANALYSIS OF METHODOLOGICAL BASIS FOR PULSED VOLTAGE-WITHSTAND TESTING OF SEMICONDUCTOR ELECTRONIC DEVICES IN ACCORDANCE WITH REGULATORY DOCUMENTATION

Autor:	Production Enterprise, Pulsar, Scientific, D.O. Vanichkin, Production Enterprise \\'Pulsar\\', I.Ya. Gantman, E.T. Avrasin, E.N. Vologdin, V.F. Sinkevich
Rok vydání:	2018
Předmět:	Regulatory documentation Semiconductor Basis (linear algebra) business.industry Computer science Electrical engineering Electronics business Voltage
Zdroj:	Electronic engineering. Series 2. Semiconductor devices. 248:35-48
ISSN:	2073-8250
DOI:	10.36845/2073-8250-2018-248-1-35-48
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::466a44d6ff5beac0e8678f6acd64771e https://doi.org/10.36845/2073-8250-2018-248-1-35-48 Zobrazit plný text záznamu