Research on Convnet and YOLO Method for Defect Detection of Printed Products
| Autor: | Huibai Wang, Shuyi Wu |
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| Rok vydání: | 2022 |
| Zdroj: | 2022 IEEE 5th Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC). |
| Databáze: | OpenAIRE |
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