Effect of Film Thickness on Magnetic Properties of FePt Thin Films Deposited on Amorphous ${\rm SiO}_{2}$ Substrate Directly
| Autor: | G.P. Lin, K.T. Huang, Chi-Kai Shen, S.C. Chen, P. C. Kuo |
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| Rok vydání: | 2011 |
| Předmět: | |
| Zdroj: | IEEE Transactions on Magnetics. 47:3889-3892 |
| ISSN: | 1941-0069 0018-9464 |
| Popis: | FePt thin films with different thicknesses (2.5-30 nm) were deposited alternately with Fe and Pt layers on amorphous SiO2 substrate without any underlayer and then were postannealed at 700°C for 30 min. The dependences of microstructures, degree of ordering, and magnetic properties on FePt film thickness were investigated. The fct-FePt (001) texture films could be obtained by dc magnetron sputtering of (Fe/Pt)n multilayer on amorphous SiO2 substrate after annealing at 700°C for 30 min. The increasing degree of L10 ordering was probably due to the thicker films providing more L10-ordering nucleation sites. The island-like FePt grains formed on the SiO2 substrates as the film was thinner than 7.5 nm. Both the values of out-of-plane squareness (S⊥) and coercivity (Hc⊥) were higher than those of in-plane ones for all film thicknesses. The values of S⊥ are close to 1 and Hc⊥ are in the range of 9.0-15 kOe for FePt thin films with a thickness of 5-15 nm after annealing at 700°C for 30 min. |
| Databáze: | OpenAIRE |
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