Predictive Mutation Analysis of Test Case Prioritization for Deep Neural Networks

Autor:	Zhengyuan Wei, Haipeng Wang, Imran Ashraf, W.K. Chan
Rok vydání:	2022
Zdroj:	2022 IEEE 22nd International Conference on Software Quality, Reliability and Security (QRS).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4580ca53656f46e6dcd8e21576aeb81d https://doi.org/10.1109/qrs57517.2022.00074 Zobrazit plný text záznamu