Autor:	D. A. Pryakhin, A. D. Bulanov, V. V. Balabanov
Rok vydání:	2003
Předmět:	chemistry.chemical_compound Chemistry Impurity General Chemical Engineering Thermal dissociation Inorganic chemistry Analytical chemistry Atomic emission spectroscopy Silicon tetrafluoride General Chemistry Mass spectrometry
Zdroj:	Russian Journal of Applied Chemistry. 76:1393-1395
ISSN:	1070-4272
DOI:	10.1023/b:rjac.0000012654.22326.e5
Popis:	The possibility of preparing high-purity silicon tetrafluoride by the thermal dissociation of pure grade Na2SiF6 was studied. The impurity composition of the product was studied by IR and atomic emission spectroscopy and by mass spectrometry.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::453ab24653a0d7935aa3309c1c25b4a2 https://doi.org/10.1023/b:rjac.0000012654.22326.e5 Zobrazit plný text záznamu Full text from SpringerLink