X-ray Reflecto-Interferometry Technique Using a Microfocus Laboratory Source
| Autor: | Svetlana Lyatun, Maria Voevodina, Aleksandr Barannikov, Ivan Lyatun, Anatoly Snigirev, Irina Snigireva |
|---|---|
| Rok vydání: | 2021 |
| Předmět: |
0303 health sciences
Materials science business.industry 030303 biophysics Detector X-ray Synchrotron radiation 02 engineering and technology 021001 nanoscience & nanotechnology Interference (wave propagation) Surfaces Coatings and Films 03 medical and health sciences Interferometry Optics Temporal resolution Emission spectrum 0210 nano-technology business Beam (structure) |
| Zdroj: | Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 15:39-45 |
| ISSN: | 1819-7094 1027-4510 |
| Popis: | An X-ray interferometry technique using an X-ray microfocus laboratory source for thin-film structure research based on compound refractive lenses has been proposed. The main advantage of this technique is to use a very simplified experimental setup where a focused X-ray beam reflected from parallel flat surfaces creates an interference pattern in a wide angular range. Due to this, the interference pattern can be obtained in a single shot without the need to rotate the specimen or the detector. The applicability of this technique has been demonstrated using the MetalJet Excillium micro-focus laboratory source, which has GaKα emission line at 9.25 keV. As a result, a series of interference patterns for test sample a free-standing thin-film membrane, thickness 500 nm, was observed. Based on the obtained results the main advantages of this technique such as high spatial and temporal resolution are shown, and also possible application of the reflecto-interferometry both at the laboratory and synchrotron radiation X-ray sources are proposed. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full text from SpringerLink