Monitoring and influence analysis of flashes on insulator surface of high current diode

Autor:	张永民 Zhang Yongmin, 黄建军 Huang Jianjun, 谢霖燊 Xie Linshen, 姚伟博 Yao Weibo, 邱爱慈 Qiu Aici, 杨莉 Yang Li, 来定国 Lai Dingguo, 任书庆 Ren Shuqing
Rok vydání:	2011
Předmět:	Materials science business.industry Influence analysis Optoelectronics Insulator (electricity) High current Electrical and Electronic Engineering business Atomic and Molecular Physics and Optics Diode
Zdroj:	High Power Laser and Particle Beams. 23:1113-1116
ISSN:	1001-4322
DOI:	10.3788/hplpb20112304.1113
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::450f27317db8e0cc0eea7ea0f9351b1e https://doi.org/10.3788/hplpb20112304.1113 Zobrazit plný text záznamu