Imaging photonic crystals using Fourier plane imaging and Fourier ptychographic microscopy techniques implemented with a computer controlled hemispherical digital condenser

Autor:	Luis Grave de Peralta, Luis Molina, Meznh H. Alsubaie, Hamed Sari Sarraf, Darshan B. Desai, Maksym V. Zhelyeznyakov, Sanchari Sen, Ayrton Bernussi
Rok vydání:	2017
Předmět:	Materials science Condenser (optics) Physics::Optics 02 engineering and technology 01 natural sciences 010309 optics symbols.namesake Optics 0103 physical sciences Microscopy Electrical and Electronic Engineering Physical and Theoretical Chemistry Rayleigh scattering Image resolution Photonic crystal Plane (geometry) business.industry Resolution (electron density) 021001 nanoscience & nanotechnology Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Fourier transform Computer Science::Computer Vision and Pattern Recognition symbols 0210 nano-technology business
Zdroj:	Optics Communications. 383:500-507
ISSN:	0030-4018
DOI:	10.1016/j.optcom.2016.09.047
Popis:	Fourier plane imaging (FPIM) and Fourier ptychographic (FPM) microscopy techniques were used to image photonic crystals. A computer-controlled hemispherical digital condenser provided required sample illumination with variable inclination. Notable improvement in image resolution was obtained with both methods. However, it was determined that the FPM technique cannot surpass the Rayleigh resolution limit when imaging photonic crystals.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4505aeb1469506fc043eda4751c6a77e https://doi.org/10.1016/j.optcom.2016.09.047 Zobrazit plný text záznamu Full Text from ScienceDirect