ELemental concentrations from proton induced thick target X-ray yields

Autor:	P. Kump, Vladimir Cindro, Ž. Šmit, M. Budnar, M. Ravnikar, V. Ramšak
Rok vydání:	1990
Předmět:	chemistry.chemical_classification Nuclear and High Energy Physics Materials science Proton Base (chemistry) Alloy Analytical chemistry X-ray engineering.material Fluorescence chemistry engineering Surface roughness Test analysis Direct integration of a beam Instrumentation
Zdroj:	Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 49:157-160
ISSN:	0168-583X
DOI:	10.1016/0168-583x(90)90234-l
Popis:	A procedure for the evaluation of elemental concentrations in thick targets is presented. The algorithms collected in the program CONC include the secondary fluorescence and surface roughness correction. The data base uses the ECPSSR cross sections obtained by the direct integration procedure. Concentrations are normalized either by setting their total sum to one, with respect to the internal standard, or to the proton dose. Reliable concentrations were found for the test analysis of a copper-nickel alloy, KBr and K2Cr2O7.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::44f4b54a9de417f86f5aaa8dcdc84267 https://doi.org/10.1016/0168-583x(90)90234-l Zobrazit plný text záznamu