| Popis: |
ZnO∶Eu3+ thin films were deposited on quartz substrates by radio frequency(RF) magnetron sputtering.The lattice structure,surface morphology and photoluminescence(PL) properties were analyzed by X-ray diffractometer(XRD),scanning electron microscope(SEM) and spectrometer,respectively.Effects of RF sputtering power and heat treatment on the structure and PL properties were studied in detail.The results showed that all the ZnO films had a hexagonal wurtzite structure and a higher RF sputtering power was beneficial to(002) preferred orientation.The films' grains grew up as the RF sputtering power and heat treatment temperature increased.Moreover,we observed the phenomenon of electron transitions in intra-4f shell of Eu3+ and energy transfer from ZnO host to the doped Eu3+ in these ZnO∶Eu3+ films.Besides,as the RF sputtering power increased and after annealed at 780 ℃,the PL properties of ZnO∶Eu3+ films were obviously improved. |
