Study of the CuInSe2/Mo thin film contact stability
| Autor: | S. Raud, M.-A. Nicolet |
|---|---|
| Rok vydání: | 1991 |
| Předmět: |
Diffraction
Scanning electron microscope Annealing (metallurgy) Metals and Alloys Analytical chemistry chemistry.chemical_element Surfaces and Interfaces Microstructure Surfaces Coatings and Films Electronic Optical and Magnetic Materials Crystallography chemistry Molybdenum Transmission electron microscopy X-ray crystallography Materials Chemistry Thin film |
| Zdroj: | Thin Solid Films. 201:361-371 |
| ISSN: | 0040-6090 |
| DOI: | 10.1016/0040-6090(91)90124-g |
| Popis: | The microstructure, the composition and the homogeneity of CuInSe2 thin films deposited on molybdenum-coated glass substrates are characterized before and after annealing using X-ray diffraction. Rutherford backscattering (RBS), cross-sectional transmission electron microscopy and scanning electron microscopy. An instability of the CuInSe2-metal contact after annealing at 600°C is detected by RBS. To clarify the nature of this interraction, we have studied the Mo/Cu, Mo/In and Se/Mo couples as a function of annealing. No interaction is detected by RBS for the Mo/Cu and Mo/In bilayers but selenium does interreact with molybdenum. The formation of the MoSe2 is investigated using X-ray diffraction. |
| Databáze: | OpenAIRE |
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