Thermal deterioration mechanism of CoFeB/PdPtMn spin valves
| Autor: | Junichi Kane, Hitoshi Kanai, T. Miyajima, Kenichi Aoshima |
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| Rok vydání: | 1999 |
| Předmět: | |
| Zdroj: | Journal of Applied Physics. 85:5042-5044 |
| ISSN: | 1089-7550 0021-8979 |
| DOI: | 10.1063/1.370085 |
| Popis: | We clarified the mechanism of thermal deterioration that occurs in the CoFeB/PdPtMn spin-valve films at temperatures above 310 °C. Two kinds of CoFeB spin-valve film, Ta/NiFe/CoFeB/Cu/CoFeB/PdPtMn/Ta (B:0–3 at. %) and Ta/NiFe/CoFeB/Cu/CoFeB/FeMn/Ta (B:2 at. %), were prepared and annealed in a magnetic field. For the PdPtMn spin-valve samples, the magnetoresistance (MR) output decreased after annealing at a temperature above 330 °C and there was an increase in the interlayer coupling field of free and pin layers (Hin). There was no large change in the sheet resistance for annealing below 330 °C. For CoFe/PdPtMn(no B) spin valves, the MR output decreased during annealing at more than 310 °C and there was an increase of Hin. An addition of only 1 at. % of boron into the free and pinned layers is sufficient to obtain thermal stability. For the CoFeB/FeMn spin-valve samples, the MR output decreased for annealing above 280 °, the sheet resistance increased, and the Hin value did not change for annealing below 3... |
| Databáze: | OpenAIRE |
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