| Autor: |
Simon Yeung, Jason Goertz, Olivier Rinaudo, Lousinda Long, Peter Ouimet |
| Rok vydání: |
2004 |
| Předmět: |
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| Zdroj: |
International Symposium for Testing and Failure Analysis. |
| ISSN: |
0890-1740 |
| DOI: |
10.31399/asm.cp.istfa2004p0203 |
| Popis: |
This paper describes case histories of 0.13 um bulk CMOS technology analyses using Time Resolved Light Emission (TRLEM). Using this technique, scan chain, timing, and logic failures are shown to be quickly and decisively identified thereby meeting the need for rapid feedback on 1st silicon failures and process excursions. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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