Machine Learning-Assisted Statistical Variation Analysis of Ferroelectric Transistor: From Experimental Metrology to Adaptive Modeling

Autor:	Gihun Choe, Prasanna Venkatesan Ravindran, Jae Hur, Maximilian Lederer, André Reck, Asif Khan, Shimeng Yu
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering Electronic Optical and Magnetic Materials
Zdroj:	IEEE Transactions on Electron Devices. 70:2015-2020
ISSN:	1557-9646 0018-9383
DOI:	10.1109/ted.2023.3244764
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::441ffe5e18742cee7248e9b15f83faae https://doi.org/10.1109/ted.2023.3244764 Zobrazit plný text záznamu