Characterization of the Effects of 250 MeV Proton-Induced Total Ionizing Dose and Displacement Damage on the HCPL-625K Optocoupler

Autor: Scott Messenger, Paul Dudek, James Hack, Codie Mishler
Rok vydání: 2019
Předmět:
Zdroj: 2019 IEEE Radiation Effects Data Workshop.
Popis: This paper explores the combined effects of total ionizing dose and displacement damage caused by 250 MeV protons on the Broadcom HCPL-625K optocoupler. Proton fluences up to 4x1012 were used for this radiation test.
Databáze: OpenAIRE