High-Sensitivity Optically Modulated Scatterer for Electromagnetic-Field Measurement
Autor: | O. Merckel, Ray-Rong Lao, R.A. Dudley, Wen-Lie Liang, N. Ribiere-Tharaud, Wen-Tron Shay, Jenn-Hwan Tarng, J.-C. Bolomey, R.P. Thompson |
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Rok vydání: | 2007 |
Předmět: |
Electromagnetic field
Electromagnetics Materials science Field (physics) Terahertz radiation business.industry 020208 electrical & electronic engineering 020206 networking & telecommunications 02 engineering and technology Optical switch Light scattering Imaging phantom Optics Physics::Space Physics 0202 electrical engineering electronic engineering information engineering Sensitivity (control systems) Electrical and Electronic Engineering business Instrumentation |
Zdroj: | IEEE Transactions on Instrumentation and Measurement. 56:486-490 |
ISSN: | 0018-9456 |
DOI: | 10.1109/tim.2007.890627 |
Popis: | The optically modulated-scatterer (OMS) technique is developed for electromagnetic-field-distribution measurement with minimum disturbance to the field under test. In this paper, an OMS with newly designed photoconductive-switching structure is proposed. The performances of the new OMS are evaluated with a monostatic-field-measurement system. Measurement results show that an improvement of 6 to 8 dB in sensitivity is achieved compared to previous OMS devices. The developed OMS was used in an electromagnetic-field-distribution mapping system to measure the field distribution in a cubic phantom radiated by a mobile phone. The results show the suitability of this OMS for specific-absorption-rate measurement application |
Databáze: | OpenAIRE |
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