On-Chip Circuit for Measuring Data Jitter in the Time or Frequency Domain

Autor: M. Ishida, Mani Soma, M. Suda, Toshiyuki Okayasu, Takahiro Yamaguchi, K. Ichiyama
Rok vydání: 2007
Předmět:
Zdroj: 2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium.
DOI: 10.1109/rfic.2007.380898
Popis: An on-chip data jitter measurement circuit in 0.11-mum CMOS is demonstrated. It utilizes a data-to-clock converter, pulse generators, and an integrator followed by a sample-&-hold. The circuit outputs a data jitter waveform in real-time, and doesn't require a reference clock. Its measurement linearity is 11 muV/ps with an error of 1.56 psRMS for a 2.5 Gbps 7-stage PRBS.
Databáze: OpenAIRE