Determining the Adsorption Sites for Binary Mixtures of p-Xylene and n-Heptane in Silicalite Using FT-Raman Spectroscopy and Temperature-Programmed Desorption

Autor:	Sunil Ashtekar, and Patrick J. Barrie, Michael D. Mantle, Lynn F. Gladden, Alistair S. McLeod, Jeremy J. Hastings
Rok vydání:	2000
Předmět:	Heptane Thermal desorption spectroscopy Analytical chemistry p-Xylene Spectral line Surfaces Coatings and Films chemistry.chemical_compound Adsorption chemistry Desorption Materials Chemistry Molecule Physical and Theoretical Chemistry Spectroscopy
Zdroj:	The Journal of Physical Chemistry B. 104:5281-5287
ISSN:	1520-5207 1520-6106
DOI:	10.1021/jp993966+
Popis:	FT-Raman spectroscopy and temperature-programmed desorption (TPD) measurements have been used to gain information on the preferred adsorption sites for p-xylene and n-heptane adsorbed within silicalite. FT-Raman spectroscopy is used to probe the location of adsorbed p-xylene, both when pure p-xylene is adsorbed and for the binary mixtures. The TPD measurements in combination with the FT-Raman spectra are used to infer the location of the adsorbed n-heptane. The results on the preferred adsorption sites for pure adsorbates are consistent with those in the literature. The results on binary mixtures show unusual behavior at loadings of four p-xylene/three n-heptane and three p-xylene/four n-heptane molecules per unit cell. In contrast to the behavior for single component adsorption, at these loadings the n-heptane molecules preferentially occupy the straight channels of silicalite, forcing the p-xylene molecules out of their normal preferred site (the channel intersections) and into the zigzag channels. The ...
Databáze:	OpenAIRE
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