Argon atoms insertion in diamond: New insights in the identification of carbon C 1s peak in X-ray photoelectron spectroscopy analysis
| Autor: | Jesus J. Alcantar-Peña, Miguel Jose Yacaman, Maria J. Arellano-Jimenez, Jean François Veyan, Jorge Montes-Gutierrez, Elida de Obaldia, Orlando Auciello |
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| Rok vydání: | 2018 |
| Předmět: |
Argon
Materials science Ion beam Binding energy Analytical chemistry Diamond chemistry.chemical_element 02 engineering and technology General Chemistry Electron engineering.material 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences X-ray photoelectron spectroscopy chemistry engineering General Materials Science Graphite Diamond cubic 0210 nano-technology |
| Zdroj: | Carbon. 134:29-36 |
| ISSN: | 0008-6223 |
| DOI: | 10.1016/j.carbon.2018.03.053 |
| Popis: | The C 1s peak's electron binding energy position in X-ray photoelectron spectroscopy (XPS) analysis of single crystal diamond (SCD) and crystalline and polycrystalline diamond and graphite films has been extensively investigated. A key issue is the experimental identification of C 1s peaks position from graphite sp2 and diamond sp3 C-atoms bonding in the diamond lattice, based on expected energy shifts of C 1s peaks from theory. Because of material charging upon electron photoemission, the absolute binding energy of the C 1s/sp3 related peak cannot be determined. The systematic study of C 1s peaks from XPS analysis of crystalline diamond, polycrystalline diamond films and graphite show key findings: 1) Ar+ ion bombardment is a reliable technique to characterize Diamond vs graphite materials during XPS analysis; 2) A low energy peak reported as C 1s/sp2 bonding, is attributed to the C 1s/sp3 in the presence of Ar atoms inserted in the lattice. 3) The data show direct correlation between the energy of the Ar+ ion beam used for surface sputter-cleaning and binding energy shifts of XPS C 1s peaks. |
| Databáze: | OpenAIRE |
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