DRC-BASED SELECTION OF OPTIMAL PROBING POINTS FOR CMIP-INTERNAL MEASUREMENTS

Autor:	K. Helmreich, C. Kuntzsch, R. Scharf, W. Wolz, K.D. Muller-Glaser
Rok vydání:	2005
Předmět:	Structure (mathematical logic) Engineering Design rule checking business.industry Circuit design computer.software_genre Area measurement Circuit extraction Set (abstract data type) Electronic engineering Data mining Physical design business computer Selection (genetic algorithm)
Zdroj:	ITC
DOI:	10.1109/test.1992.527908
Popis:	This paper introduces a new method for the selection of optinuxl probing points in chip-internal e-beam testing by applying a set ofprobingpoint selection rules to the complete area of the desired wire. Conznzvrcially available design rule check (DRC) tools are used to perform the required topological operations. For easy adaption to different technologies, a rule definition language hus been developed to allow forthedefinition ofrules independent of the utilized DRCtool. Theyrobingpointselection is such thut loculfield eflects, crosstalk and circuit structure influences are nzininzized.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::433ab4ccd512148aa1773a91d6becc3d https://doi.org/10.1109/test.1992.527908 Zobrazit plný text záznamu