Characterization of Frameless Double Glass Silicon Cells Modules with a New Accelerated Aging Test Procedure
| Autor: | Dupuis, J., Lajoie-Mazenc, E., Sicard, F., Binesti, D., Mousel, S., Radouane, K. |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2018 |
| Předmět: | |
| DOI: | 10.4229/35theupvsec20182018-5cv.3.18 |
| Popis: | 35th European Photovoltaic Solar Energy Conference and Exhibition; 1300-1305 A new accelerated aging test procedure for photovoltaic modules developed by EDF R&D is presented. This test sequence focus on activating specific failure mode mechanisms. The different sequences are then applied to two sets of unframed double glass modules to evaluate its robustness in detecting weaknesses. The results show very robust module conception with degradation inferior to 3% despite aging test sequences well beyond classical IEC standards. Using the procedure and extended aging tests, evidence of slight yellowing during damp heat test were detected. The robustness of the module tested suggests that the aging test sequence need to be completed with more precise characterization method and adapted to the different module technologies available (half cut cell, thin films…). |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|