Electromigration in tin-bismuth planar solder joints
Autor: | Prabjit Singh, L. Palmer, M. Hamid, T. Wassick, R. F. Aspandiar, B. Franco, H. Fu, Richard Coyle, Faramarz Hadian, V. Vasudevan, A. Allen, K. Howell, K. Murayama, H. Zhang, A. Lifton, M. Ribas, M. Sarangapani, T. Munson, S. Middleton |
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Rok vydání: | 2023 |
Zdroj: | 2023 International Conference on Electronics Packaging (ICEP). |
DOI: | 10.23919/icep58572.2023.10129714 |
Databáze: | OpenAIRE |
Externí odkaz: |