Peculiarities of the memory state formation in thin Ge2Sb2Te5 films

Autor: S A Fefelov, L P Kazakova, N A Bogoslovskiy, A O Yakubov, A B Bylev
Rok vydání: 2021
Předmět:
Zdroj: Journal of Physics: Conference Series. 2103:012087
ISSN: 1742-6596
1742-6588
DOI: 10.1088/1742-6596/2103/1/012087
Popis: The current-voltage characteristics of Ge2Sb2Te5 thin films were measured by a sequence of triangular current pulses with an increasing maximum current. Each current pulse forms in the sample a conducting filament with an area proportional to the maximum current in the recording pulse.
Databáze: OpenAIRE