Reliability Improvement of Gate-All-Around Junctionless SONOS Memory by Joule Heat From Inherent Nanowire Current

Autor:	Jung-Woo Lee, Joon-Kyu Han, Myung-Su Kim, Ji-Man Yu, Jin-Woo Jung, Seong-Yun Yun, Yang-Kyu Choi
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering Electronic Optical and Magnetic Materials
Zdroj:	IEEE Transactions on Electron Devices. 69:6133-6138
ISSN:	1557-9646 0018-9383
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::427e12bca101fda250d596bb214c85bf https://doi.org/10.1109/ted.2022.3209646 Zobrazit plný text záznamu