Effect of capping layer on formation and magnetic properties of MnBi thin films
| Autor: | Patrick Quarterman, Yang Lv, Karl B. Schliep, Thomas Peterson, Jian-Ping Wang, Delin Zhang |
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| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Materials science Condensed matter physics General Physics and Astronomy 02 engineering and technology 021001 nanoscience & nanotechnology Magnetocrystalline anisotropy 01 natural sciences Surface energy Magnetic anisotropy Magnetization Ferromagnetism Transmission electron microscopy 0103 physical sciences Thin film 0210 nano-technology Layer (electronics) |
| Zdroj: | Journal of Applied Physics. 122:213904 |
| ISSN: | 1089-7550 0021-8979 |
| DOI: | 10.1063/1.5001081 |
| Popis: | We report on the effect of varied capping layers on the formation of thin film MnBi, and the associated magnetic and crystalline properties for use in magnetic memory. MnBi thin films with a capping layer of either Ta, SiO2, Cr, or Au were grown, and it was observed that the magnetic properties vary significantly depending on the capping layer. Continuous 20 nm MnBi thin films capped with Ta and SiO2 show ferromagnetism with large perpendicular magnetocrystalline anisotropy, however, films capped with Cr and Au show no ferromagnetic behavior. In this work, MnBi thin films have been characterized utilizing magnetization vs. field, x-ray diffraction, cross-section transmission electron microscopy, and optical microscopy. We show that the capping layer plays a significant role in the formation of the low temperature phase MnBi structure and propose that the underlying cause is due to a surface energy difference for the MnBi//Au and MnBi//Cr interface, which allows for Mn oxidation, and prevents the formation... |
| Databáze: | OpenAIRE |
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