Incidence of multi-particle events on soft error rates caused by n-Si nuclear reactions

Autor:	H. Duarte, Frédéric Wrobel, M.-C. Calvet, J.-M. Palau, O. Bersillon
Rok vydání:	2000
Předmět:	Nuclear reaction Physics Nuclear and High Energy Physics Range (particle radiation) Meson Electron Ion Nuclear physics Nuclear Energy and Engineering Single event upset Neutron Spallation Electrical and Electronic Engineering Atomic physics
Zdroj:	IEEE Transactions on Nuclear Science. 47:2580-2585
ISSN:	1558-1578 0018-9499
Popis:	Neutron reactions with silicon nuclei can be responsible for much of the soft errors rate (SER) observed, for instance, in high density memories. The nuclear reactions create ionizing particles that then can induce charge collection at sensitive nodes. In many cases, the nuclear reaction produces a shower of ions. Models for the prediction of SER are much more complicated if all the simultaneously created ions must be considered. In this paper, we examine the proportion of events in which a shower of particles is actually involved. Spallation reaction effects for incident neutrons in the 50-2000 MeV energy range are analyzed using a simple spherical structure. Calculations are performed using BRIC (B_ruyeres le Chatel I_ntra-nuclear C_ascade), an improved version of HETC (High Energy Transport Code). The results show that the proportion of events actually due to showers is less than 2% of the total number of SER's.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4228556441b42b92f70d0c92b77650f3 https://doi.org/10.1109/23.903812 Zobrazit plný text záznamu