Inelastic mean-free path and mean escape depth of 10–140 eV electrons in SiO2 nanoparticles determined by Si 2p photoelectron yields
| Autor: | E. Antonsson, F. Gerke, B. Langer, C. Goroncy, T. Dresch, T. Leisner, C. Graf, E. Rühl |
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| Rok vydání: | 2023 |
| Předmět: | |
| Zdroj: | Physical Chemistry Chemical Physics. |
| ISSN: | 1463-9084 1463-9076 |
| Popis: | We report on photoelectron spectra of SiO2 nanoparticles (d = 157 ± 6 nm) above the Si 2p threshold in the photon energy range 118–248 eV with electron kinetic energy 10–140 eV and analyze the photoelectron yield as a function of photon energy. |
| Databáze: | OpenAIRE |
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