Analysis of a Transistor-Based On-State Voltage Measurement Circuit for Condition Monitoring of Power Transistors
| Autor: | Kevin Muñoz Barón, Mathias C. J. Weiser, Kanuj Sharma, Ingmar Kallfass |
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| Rok vydání: | 2023 |
| Zdroj: | 2023 IEEE Applied Power Electronics Conference and Exposition (APEC). |
| DOI: | 10.1109/apec43580.2023.10131156 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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