Surface Properties and Porosity of Silica Particles Studied by Wide-Angle Soft X-ray Scattering
| Autor: | Christopher Raschpichler, Burkhard Langer, Eckart Rühl, Christina Graf, Christian Goroncy, Toralf Lischke, B. Wassermann, E. Antonsson, Patrick Klack |
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| Rok vydání: | 2020 |
| Předmět: |
Surface (mathematics)
Soft x ray Materials science Scattering Astrophysics::High Energy Astrophysical Phenomena Mie scattering 02 engineering and technology 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences Surfaces Coatings and Films Electronic Optical and Magnetic Materials General Energy Surface roughness Physical and Theoretical Chemistry Composite material 0210 nano-technology Porosity Beam (structure) |
| Zdroj: | The Journal of Physical Chemistry C. 124:16663-16674 |
| ISSN: | 1932-7455 1932-7447 |
| Popis: | Wide-angle soft X-ray scattering on free silica particles of different porosity prepared in a beam is reported. The explored q region is mostly dominated by features due to surface roughness and bu... |
| Databáze: | OpenAIRE |
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