A derivation of the electrical capacitance tomography sensitivity matrix
| Autor: | Robert C Youngquist, Jedediah M Storey, Mark A Nurge, Christopher J Biagi |
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| Rok vydání: | 2022 |
| Předmět: | |
| Zdroj: | Measurement Science and Technology. 34:025404 |
| ISSN: | 1361-6501 0957-0233 |
| Popis: | The sensitivity matrix, used in electrical capacitance tomography to connect capacitance readings to a dielectric distribution, is derived without assumptions on the magnitude of the relative permittivity and without dropping higher order terms. Deriving this matrix may provide a means to improve the performance of the various published electrical capacitance tomography algorithms and extend their applicability to a wider range of dielectric materials. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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