The true spectrum of tribo-generated X-rays from peeling tape
| Autor: | Juan V. Escobar, M. C. Hernández-Hernández |
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| Rok vydání: | 2019 |
| Předmět: |
010302 applied physics
Work (thermodynamics) Materials science Physics and Astronomy (miscellaneous) business.industry Spectrum (functional analysis) Detector Solid angle 02 engineering and technology Photon energy 021001 nanoscience & nanotechnology 01 natural sciences Spectral line Characterization (materials science) Optics 0103 physical sciences Total energy 0210 nano-technology business |
| Zdroj: | Applied Physics Letters. 115:201605 |
| ISSN: | 1077-3118 0003-6951 |
| DOI: | 10.1063/1.5129277 |
| Popis: | X-rays generated through tribological processes differ from those obtained with conventional X-ray tubes in that a substantial portion of the total energy is emitted in pulses of order 10 ns in duration. The short duration of these pulses usually causes solid-state detectors to register pileup events that can make the corresponding spectrum unreliable as a characterization tool. In this work, we find that a solid angle subtended by the detector of 5 × 10 − 6 is necessary to obtain the true spectra of X-rays generated from peeling adhesive tape in a moderate vacuum. The maximum individual photon energy is found to be 30 keV, which is about half of that reported in previous studies that overlook the effects of pileup. Being able to obtain a reliable spectrum may help us understand the physical processes behind this phenomenon so that it can be optimized for present and future applications. |
| Databáze: | OpenAIRE |
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