Projection mask-less lithography (PML2): First results from the multi beam blanking demonstrator

Autor: Christoph Brandstaetter, Ernst Haugeneder, Stefan Eder-Kapl, Hans-Joachim Doering, Helmut Langfischer, Martin Witt, Joerg Eichholz, Joachim Heinitz, Klaus Reimer
Rok vydání: 2006
Předmět:
Zdroj: Microelectronic Engineering. 83:968-971
ISSN: 0167-9317
Popis: A proof-of-concept multi beam blanking device (''blanking demonstrator'') has been fabricated for the projection mask-less lithography project. It comprises a Si chip with approx. 4000 openings (each has a size of 8x8@mm^2) etched through with adjacent blanking electrodes fabricated by electroplating. The parameters of the blanking demonstrator such as electrode layout and density of openings are identical to the blanking device of the final production tool. The demonstrator is being tested within a dedicated broad beam electron beam teststand, which has proven to resolve
Databáze: OpenAIRE