| Autor: |
E. N. Farabaugh, R. W. Armstrong, H. S. Parker |
| Rok vydání: |
1973 |
| Předmět: |
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| Zdroj: |
Journal of Applied Crystallography. 6:482-486 |
| ISSN: |
0021-8898 |
| Popis: |
The most commonly used geometry for the Berg–Barrett X-ray microscopy uses the zero-layer reflections as described by Newkirk. It can be shown that non-zero-layer reflections, skew-plane reflections, can be used equally well to obtain X-ray micrographs. The analysis of the stereographic representation of the skew-reflection geometry demonstrates the many usable reflections and gives the conditions for minimum image distortion. In these X-ray micrographs the contributions to diffraction contrast from shadowing and sub-boundaries can be identified. An estimate of the height of steps occurring on the crystal surface can also be made. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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