Transverse electric (TE) and transverse magnetic (TM) X-ray guided modes in a two-layer crystalline heterostructure: A comparison
| Autor: | I. R. Prudnikov |
|---|---|
| Rok vydání: | 2012 |
| Předmět: |
Diffraction
Materials science Condensed matter physics business.industry Guided-mode resonance Astrophysics::High Energy Astrophysical Phenomena X-ray Physics::Optics Heterojunction Condensed Matter Physics Polarization (waves) Electronic Optical and Magnetic Materials Transverse magnetic Transverse plane Optics Electrical and Electronic Engineering business Excitation |
| Zdroj: | Physica B: Condensed Matter. 407:4136-4142 |
| ISSN: | 0921-4526 |
| DOI: | 10.1016/j.physb.2012.06.037 |
| Popis: | Polarization effects upon Bragg-case hard X-ray dynamical diffraction in a two-layer crystalline heterostructure waveguide have been investigated with the help of numerical modeling. A difference is shown to exist in both intensities and excitation conditions between TE (transverse electric) and TM (transverse magnetic) X-ray guided modes that are inherent to the waveguide. A comparison of σ- and π-polarized X-ray reflectivity curves from such a waveguide is performed. Possibilities for the experimental excitation of the TE and TM X-ray guided modes are discussed. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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