Thin Film Parameters Based on Polarized Light Reflected from the Multi-Point Measurement

Autor:	黄佐华 Huang Zuohua, 宋亚杰 Song Yajie, 王泽斌 Wang Zebin, 周进朝 Zhou Jinzhao, 曾宪佑 Zeng Xianyou
Rok vydání:	2012
Předmět:	Polarized light microscopy Optics Materials science business.industry Electrical and Electronic Engineering Thin film business Atomic and Molecular Physics and Optics Multi point Electronic Optical and Magnetic Materials
Zdroj:	Chinese Journal of Lasers. 39:1207002
ISSN:	0258-7025
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::40899f90bd1e6fb9ec1036dc6489805b https://doi.org/10.3788/cjl201239.1207002 Zobrazit plný text záznamu