Depth-resolved photoemission spectroscopy from surface and buried layers with soft X-ray standing waves

Autor:	A.W. Kay, B.S. Mun, Jeffrey B. Kortright, S.-K. Kim, Charles S. Fadley, J.H. Underwood, S.-H. Yang, Z. Hussain
Rok vydání:	2000
Předmět:	Diffraction Materials science Photoemission spectroscopy Scattering business.industry X-ray standing waves Bragg's law Surfaces and Interfaces Condensed Matter Physics Molecular physics Surfaces Coatings and Films Standing wave Optics Materials Chemistry Spectroscopy business Excitation
Zdroj:	Surface Science. 461:L557-L564
ISSN:	0039-6028
DOI:	10.1016/s0039-6028(00)00617-8
Popis:	A new type of depth-resolved soft X-ray photoemission spectroscopy (SXPS) is carried out in which depth sensitivity is provided by means of a periodic multilayer {[B 4 C(22.5 A)–W(17.1 A)] 40 } that possesses sizeable standing wave effects of ±∼50–60% for soft X-rays at hν ≈750 eV. The photoelectron intensities of each element in the sample, including impurity overlayers, are sharply altered when the incidence angle is tuned over the Bragg condition, in excellent agreement with theoretical simulations. The angular dependence of photoelectron intensity also shows unique chemical-state-resolved behavior depending on the location of a given species in the multilayer structure. Depth-resolved SXPS with soft X-ray standing wave excitation should thus be a very useful tool for studying surface and interface chemical, electronic, and magnetic properties.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3fc08537b54858ddab9fc40884da1336 https://doi.org/10.1016/s0039-6028(00)00617-8 Zobrazit plný text záznamu Full Text from ScienceDirect