High-Resolution-Electron-Microscopy Investigation of Nanosize Inclusions

Autor: S.Q. Xiao, E. Johnson, U. Dahmen, A. Johansen
Rok vydání: 1997
Předmět:
Zdroj: MRS Bulletin. 22:49-52
ISSN: 1938-1425
0883-7694
Popis: The behavior of solids in the nanometer size regime, as their dimensions approach the atomic scale, is of increasing fundamental and applied interest in materials research. Electronic, optical, magnetic, mechanical, or thermodynamic properties all may depend on the size and shape of the solid. As a result, in the nanoscale regime, size and shape may be used as design variables to tailor a material's properties such as giant magnetoresistance in multilayer films, or the optical properties in semiconductor nanocrystals. In most cases, the size dependence of properties is not well-understood. Nanophase materials constitute a new frontier in materials science, and accurate nanoscale characterization is extremely important in exploring this new frontier. In this area, transmission electron microscopy (TEM) plays a key role. Because of its unique ability to provide information on the structure and composition of internal interfaces in solids, TEM is particularly important in cases of buried nanophase structures such as small solid inclusions—that is, solid particles embedded within another solid.Nanoscale inclusions have recently been shown to exhibit unusual melting behavior that depends strongly on their size and the embedding matrix. For example, small inclusions of Pb in SiO exhibit melting-point depressions of several hundred degrees, whereas similarsized Pb inclusions in aluminum have shown large increases in melting point. Although a full understanding of these effects is still lacking, it appears that they are related not just to inclusion size but also to their shape and interface structure.
Databáze: OpenAIRE
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