Comparison of failure mechanisms of ESD GGNFET subjected to VFTLP robustness and reliability tests
| Autor: | S. Y. Chow, C. K. Koh, Weng Hong Lai, Y. Chen, B. S. Khoo |
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| Rok vydání: | 2012 |
| Předmět: | |
| Zdroj: | 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits. |
| DOI: | 10.1109/ipfa.2012.6306320 |
| Popis: | An ESD GGNFET was swept with increasing voltage to failure using VFTLP. Another sample was stressed to 65% of the Vt2 obtained in the first test. The second sample failed after a large enough number of sweeps. The difference in the failure mechanisms for these two samples is reported for the first time. |
| Databáze: | OpenAIRE |
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