Effects and Regularity of Different Slit & Bar Design on TFT Characteristics

Autor: 郭建 Guo Jian, 刘翔 Liu Xiang, 金基用 Kim Ki-yong, 薛建设 Xue Jian-she, 明星 Ming Xing, 周伟峰 Zhou Wei-feng, 陈旭 Chen Xu, 闵泰烨 Min Tai-ye
Rok vydání: 2011
Předmět:
Zdroj: Chinese Journal of Liquid Crystals and Displays. 26:165-169
ISSN: 1007-2780
DOI: 10.3788/yjyxs20112602.0165
Popis: By analyzing the relation among different slit bar design of mask,TFT channel profile and electric characteristic,it's found that the TFT electric characteristic,ripple size and channel FICD bias are becoming better while slit or bar size decreases.The slit size has greater influence than bar size on TFT characteristic.Considering the ratio of short in the corner of channel,the small slit bar design is suitable for four mask processing,and the corner defect can be avoided by tuning bar size.
Databáze: OpenAIRE