A design based on proven concepts of an SEU-immune CMOS configuration data cell for reprogrammable FPGAs

Autor:	L.R. Rockett
Rok vydání:	2001
Předmět:	Digital electronics business.industry Computer science Circuit design General Engineering Hardware_PERFORMANCEANDRELIABILITY CMOS Single event upset Embedded system Logic gate State (computer science) business Field-programmable gate array System bus
Zdroj:	Microelectronics Journal. 32:99-111
ISSN:	0026-2692
DOI:	10.1016/s0026-2692(00)00134-8
Popis:	This paper describes the design and operation of a single-event upset (SEU) immune CMOS logic-configuration data cell design for reprogrammable digital logic circuits. The configuration data cell design is based on proven concepts. The data cell consistently assumes a prescribed data state when powered-up thus minimizing turn-on power dissipation and preventing data bus contention. Control signal pulses can be applied to selectively read the state of a data cell and to selectively set a data cell to a desired data state. Regardless of the data being stored, the data cell is SEU-immune. Circuit simulations are used to verify the full operation and SEU-immunity of the data cell design, even at worst case conditions.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3f1a36dc3186bc097bca510d13e0dd5c https://doi.org/10.1016/s0026-2692(00)00134-8 Zobrazit plný text záznamu Full Text from ScienceDirect